D. List of Acronyms and Symbols

This appendix lists acronyms and symbols specific to SWS in Tables D.1 and D.2. For a more general list of acronyms we refer to the ISO Handbook Volume I.

Table D.1: List of acronyms

acronym	Description
AA	Auto Analysis - software used to process data, see Section 7.3
AAR	Auto Analysis Result file - output of AA, defined in Section A.4.1
AIT	Assembly and Integration Tests
AIV	Assembly and Integration Verification
AOT	Astronomical Observation Template - see Chapter 3
CAM	ISO Camera - one of the four instruments on board ISO
CoCo	Configuration Control
CSH	Compact Status History file, defined in Section A.2.2
CUS	Calibration Uplink System
DAAR/Derive-AAR	The OLP stage that processes SPD data to the AAR level. See Section 7.3
DIDAC	Dutch ISO Data Analysis Centre at SRON in the Netherlands
DSPD/Derive-SPD	The OLP stage that processes ERD data to the SPD level. See Section 7.2
EMC	Electro-Magnetic Compatibility
EOHA	Executed Observation History per AOT (CHECK)
EOHI	Executed Observation History per ICS
ERD	Edited Raw Data - raw data from the satellite, defined in Section A.2.1
FITS	Flexible Image Transport System
FM	Flight Model (of SWS)
FPG	Focal Plane Geometry
FS	Fouks-Schubert transient model
FWHM	Full Width at Half Maximum
FP	Fabry-Pérot Spectrometer
FPU	Focal Plane Unit
GEHK	General House Keeping
IA/SIA	Interactive Analysis - a software package to analyse SWS data
ICS	Instrument Command Sequence
IDA	ISO Data Archive - the legacy archive in VILSPA, Spain
IDPD	ISO Data Product Document - see [34]
IDT	Instrument Dedicated Team
ILT	Instrument Level Test (SWS laboratory test)
IRPH	Instrument Reference Pointing History
ISAP	ISO Spectral Analysis Package
ISO	Infrared Space Observatory - home of SWS, LWS, CAM and PHOT
ISOSDC	ISO Spectrometer Data Centre at MPE, Garching (Germany)
ITK	Instrument Time Key - see the ISO Handbook Volume I for a description
	of this key
JFET	Junction Field Effect Transistor
LW	Long Wavelength section of SWS
LWS	ISO Long Wavelength Spectrometer - one of the four instruments on board ISO
LVDT	A measure of the angle of the scan mirror for the gratings. It is given the term
	`LVDT' as this angle is measured by a Linear Voltage Differential Transducer
OLP	Off-Line Processing - the pipeline, also known as SPG
OSIA	Observers SWS Interactive Analysis - IA without the specific calibration parts
PA	Product Assurance
PHT/PHOT	ISO Photo-polarimeter - one of the four instruments on board ISO
QLA	Quick Look Analysis - a quick assessment carried out on the data
PV	Performance Verification - Early phase in the mission
RC	Resistor-Capacitance circuit responsible for curvature in the integration ramps
RSRF	Relative Spectral Response Function
RTA	Real Time Assessment - a quick assessment carried out on the data
SED	Spectral Energy Distribution
SIDT	SWS Instrument Dedicated Team
SNR	Signal-to-Noise Ratio
SOC	Science Operations Centre (Villafranca)
SPD	Standard Processed Data file - output of DSPD, defined in Section A.3.1
SPG	Standard Product Generation - the pipeline, also known as OLP
SPOPS	SWS Post-Operations
SSO	Solar System Object.
SW	Short Wavelength section of SWS
SWGH	SWS Glitch History Data file - output of DSPD, defined in Section A.3.2
SWS	ISO Short Wavelength Spectrometer - one of the four instruments on board ISO
TDATA	Transparent Data
TDF	Telemetry Distribution Format
TDT	Target Dedicated Time
UTK	Uniform Time Key - see ISO Handbook Volume I for a description of this key
ZLF	Zero Level Function in FS model

Table D.2: List of symbols

symbol	Description
$\beta$	Instantaneous gain in FS transient model
	Angle between optical axis and aperture (degree)
$C$	Cross talk matrix
	Covariance matrix
$\chi^2$	Quadratic misfit between model and data
$d$	Fabry-Pérot gap width
$D$	Grating constants (lines/mm)
$D_k$	Data samples, measured readouts from the ERD. (bits)
$\delta$	Angle between optical axis and detector (degree)
$\Delta$t	Time interval (s)
$F$	Flux density (Jy)
$G$	Gain factor
$G_{AD}$	Analogue to Digital conversion factor
$G_c$	Flux conversion factor (Jy s/$\mu$V)
$G_f$	Flat-field gain
$G_p$	Photometric gain factor
$G_{pre}$	Pre-amplifier gain
$G_r$	Gain factor due to RSRF
$H(t)$	Unit step function at t=0
$L_{AOT}$	Number of scan steps per band
$L_{F}$	Number of scan steps per FWHM of spectral resolution
$L_{s}$	Step size in scanner steps
$\lambda$	Wavelength
$\Lambda$	Decay time in the FS transient model
$mas$	Milliarcseconds
$n$	Fabry-Pérot order
$n_i$	Number of integrations
$n_{int}$	Number of samples taken from a single spectral resolution element
$n_{scan}$	Number of scans
$n_{step}$	Number of steps
$N$	Grating or FP order
$N_D$	Dark current noise
$O$	Offset
$p$	Glitch height
$R$	Spectral Resolution
$S$	Signal Strength ($\mu$V/s)
$S_d$	Signal in the dark current
$\sigma$	Standard deviation
$t$	time (sec)
$t_r$	Detector reset interval (sec)
$\tau$	AC time constant
$V$	(Modeled) readouts
$Z$	Zero level function in FS model