Measurements of noise for various reset times and signal levels during the SWS instrument level tests resulted in the following characterization of the noise behaviour of the F-P detector and integrating preamplifier system:
with S the signal in V/s and
dimensionless (happens to be equal to
the reset time in seconds).
The empirically determined noise parameters
(read noise, in
V/s)
(dark current noise, in
V/s), and
(signal shot noise,
V
/s
) for the two
F-P detector materials are summarized in Tab. 5.3.
Band | 5 | 6 |
detector | FP-Si:Sb | FP-Ge:Be |
range ( ![]() | 11.4-26 | 26-44.5 |
![]() | 0.63 | 0.89 |
![]() | 1.00 | 3.00 |
![]() | 0.18 | 0.13 |