next up previous contents index
Next: ISO observations of globular Up: Poster session C Interstellar Previous: X-RAY vs.IR sources in

Atomic silicon in Orion

C. Gry 1, G. Pineau des Forêts 2, & C.M. Walmsley 3

1 LAS, BP 8, F-13376 Marseille cedex 12

2 DAEC, Observatoire de Paris, Place Janssen, 92190 Meudon, France

3 Osservatorio Astrofisico di Arcetri, Firenze, Italy




We have used the LWS in order to measure the atomic silicon fine structure lines at 68.5 and 129.7 $\rm\mu m$ towards the Orion Kleinmann-Low nebula. We used the AOT LWS04 with a spectral resolution of roughly 10000. At the wavelength of the 68.5 $\rm\mu m$ feature, we find a feature of intensity $\rm 6.1 \times 10^{-19} W cm^{-
2}$ (error $\rm0.9 \times 10^{-19} W cm^{-2}$) and of width corresponding to the instrumental resolution. The S/N achieved on the continuum is 700. At the wavelength of the 129 $\rm\mu m$ line, we presently only derive an upper limit. For temperatures above 100 K, we estimate that our observed 68.5 $\rm\mu m$ feature corresponds to a SiI column density in the range $\rm 8 \times 10^{14}$ to $\rm 5 \times
10^{15} cm^{-2}$ as compared with an ionized Si column density (from observations of the SiII 34 $\rm\mu m$ transition by Haas et al. of $\rm 10^{16} cm^{-2}$. We discuss the interpretation of this in the framework of current shock and PDR models.


next up previous contents index
Next: ISO observations of globular Up: Poster session C Interstellar Previous: X-RAY vs.IR sources in
"The Universe as seen by ISO", 20 - 23 October 1998, Paris: Abstract Book